Non-contact XY mapping measurement infrared thickness gauge film thickness measurement device
Infrared Non-Contact Thickness Gauge "Easy Operation and Maintenance-Free!"
<X-Y Mapping Measurement Possible> Mapping measurements can be performed while moving the work in the XY direction. <Ready-to-Use Operability> Automatically creates a calibration curve from the reference piece. Measurement can be started immediately. <Maintenance-Free> There are no short-term replacement parts such as light sources or line sources.
- Company：アイオプチカ
- Price：5 million yen-10 million yen
